50GHz s-para/NF Test-Bed

Description

This test-bed is capable of providing very high-precision semiconductor active/passive device/circuits characterization including DC~50GHz small-signal s-parameters and 10MHz~26.5GHz noise figure measurements.

Status

You must first log in to see the status.

Location

GEDC

Capabilities

None listed.

Shared Drive

No share drive for this equipment.

on this page

contact

• Users
• Trainers

help

• Operating Instructions
• Service Request

Schedule

You must first log in to see the schedule.

Equipment with Similar Capabilities

No similar equipment.

Standard Recipes and Reports

You must first log in to see the standard recipe files.

User Shared Files

You must first log in to see shared files.

Billing Rates

There are no hourly rates for this equipment. You will only be charged for cleanroom time.

See our rates for more information.

Service Requests

You must first log in to see service requests for the 50GHz s-para/NF Test-Bed.

Equipment Log

You must first log in to see the equipment log for the 50GHz s-para/NF Test-Bed.

Training Sessions

Choose from the sessions below or request a new time.