The FIB-Center at GT (FIB2) Moves to NRC

Published: Sept. 13, 2007, midnight

FIB-Center will become a visible component of the Microelectronics Research Center (MiRC), located in Pettit Room 160

Dear Core PIs, Dear Colleagues, Dear FIB users:

After extensive discussions on the future of the FIB-Center at Georgia Tech beyond the NSF funding period and its sustained maintenance and growth, we are honored to announce that the FIB-Center will become a visible component of the Microelectronics Research Center (MiRC), and will relocate to the Pettit Building, room 160. Both FIB-SEM systems will be operated outside the Cleanroom, and full access for users who do not require Cleanroom conditions (e.g., for TEM sample preparation) remains ensured at the same conditions currently established at the FIB-Center.

We are more than pleased with this development, as the diverse background of the MiRC users base will significantly expand and enhance the FIB users community on state-of-the-art nanofabrication and -characterization with FIB-SEM technology, which ideally complements the e-beam lithography system at MiRC. We anticipate that an even broader user base will now take advantage of FIB-SEM technology, while the already existing user community at the FIB-Center will benefit from the proximity to MiRC, and its rather outstanding selection of micro- and nanofabrication technologies.

In the past, IPST has served as location for the FIB-Center during the NSF: CRIF grant period, however, not with sufficient continuity to the standards required for operating these instruments 24/7 at the highest possible quality level. As system performance, accessibility, a broad user base, and sustained maintenance of these tools is our highest priority for the on-campus, off-campus, and industrial user community, it is essential to relocate these instruments to the MiRC building, where they will be embedded within an excellent multi-user infrastructure. We hope that you will continue contributing to the expanding range of applications for FIB-SEM technology, and to the ongoing growth of the FIB Center at MiRC.

The move is planned for end of September 2007; therefore, the FIB-SEM systems will be down for approx. 2-4 weeks. Please plan accordingly. We will keep you posted on the precise downtime for the systems as the move progresses. However, we assure all users that we will make every effort in minimizing the impact on the accessibility of these essential research tools.

Please do not hesitate to approach Dr. Mizaikoff or Dr. Kranz with any questions you might have.

Boris Mizaikoff

Christine Kranz

Thomas Orlando

Kevin Martin

Jim Meindl

More News

MEMS Certificate Program

Aug. 5, 2011, midnight - The schools of ECE, MechE, and ChBE begin certificate program in MEMS for graduate students.

An Effective Lift-Off Method for Patterning High-Density Gold Interconnects on an Elastomeric Substrate

Nov. 22, 2010, midnight - A 3 cm cable of ten gold wires with 10 um width and 20 um pitch is achieved, successfully demonstrating density increases of more than one order of magnitude from previously established work.

High-Density Stretchable Electronics: Toward an Integrated Multilayer Composite

Aug. 23, 2010, midnight - Two major challenges associated with stretchable electronics-increasing integration density and improving electrical bonding-have been addressed by our innovative multilayer via-bonding technology.

Groundbreaking Research in Nanofluidics

July 19, 2010, midnight - Engineers Devin Brown and Nicole Devlin at the NRC create nanometer scale channels in a controlled, repeatable, and preferable simple way.

Simultaneous Electrical and Mechanical Disruption of Cell Membranes Improves Transfection Efficiency

March 15, 2010, midnight - OpenCell has developed and optimized a prototype device termed STEAM, which evolved from research into biomedical applications for novel micro-machined ultrasonic atomizers performed at Georgia Tech.

Thermo Scientific K-Alpha XPS

March 8, 2010, midnight - The K-Alpha is a high performance surface analysis instrument. A fully integrated, monochromatic small-spot X-Ray Photoelectron Spectrometer (XPS) system.

NanoGrip Technologies

March 4, 2010, midnight - NanoGrip Technologies specializes in precision microtools that provide manipulation and measurement capabilities for microscale structures and biological objects.

Carbon Semiconductors Clear CMOS Hurdle

Feb. 19, 2010, midnight - Georgia Tech claims to have a devised a one-step graphene doping process, paving the way for commercial fabrication.

Packaging and Characterization of Mechanically Actuated Microtweezers for Biomedical Applications

Feb. 5, 2010, midnight - This paper presents the successful design, fabrication, and packaging of a mechanically actuated micro-electro-mechanical-systems (MEMS) microtweezer.

NRC Acquires Powerful New Software or the JEOL JBX-9300FS

Sept. 29, 2008, midnight - New software will provide users with more accurate, robust, and uniform nanoscale patterning.

New X-Ray Tomography Tool Installed in NRC

Sept. 10, 2008, midnight - The NRC has just installed a new tool, the Dage XD7600-NT, in Room 161 of the Pettit Microelectronics Research Center.

The FIB-Center at GT (FIB2) Moves to NRC

Sept. 13, 2007, midnight - FIB-Center will become a visible component of the Microelectronics Research Center (MiRC), located in Pettit Room 160

Nanoimprint Lithography Now Available at Georgia Tech

Sept. 22, 2005, midnight - A NIL system was installed at the MiRC in July which enables a low-cost process of mass replication of nanoscale and microscale structures.

Nanolithography: JEOL JBX-9300FS E-beam Writer

May 24, 2005, midnight - Now scheduling training sessions and taking samples for our new E-beam lithography tool.